Measurement functions | Measurement range | Display range | Resolution | Accuracy |
---|---|---|---|---|
Fault loop impedance | ||||
Fault loop ZL-PE, ZL-N, ZL-L | 0.13 Ω…1999 Ω acc. to IEC 61557 | 0.00 Ω…1999 Ω | from 0.01 Ω | ±(5% m.v. + 3 digits) |
Fault loop ZL-PE in RCD mode | from 0.5 Ω…1999 Ω acc. to IEC 61557 | 0.00 Ω…1999 Ω | from 0.01 Ω | rom ±(6% m.v. + 5 digits) |
Measurements of RCD parameters | ||||
RCD tripping test and measurement of tripping time tA measuring current 0.5 IΔn, 1 IΔn, 2 IΔn, 5 IΔn | ||||
general and short-time delay RCD | 0 ms…300 ms | 0 ms…300 ms | 1 ms | ±(2% m.v. + 2 digits) |
selective RCD | 0 ms…500 ms | 0 ms…500 ms | 1 ms | ±(2% m.v. + 2 digits) |
Measurement of RCD tripping current IA measuring current 0.3 IΔn…2.0 IΔn | ||||
for sinusoidal residual current (AC type) | 3.0 mA…500 mA | 3.0 mA…500 mA | from 0.1 mA | ±5% IΔn |
for unidirectional residual current and unidirectional with the 6 mA DC bias (type A) | 4,0 mA…420 mA | 4,0 mA…420 mA | from 0.1 mA | ±10% IΔn |
Resistance of protective conductors and equipotential bondings | ||||
Measurement of resistance of protective conductors and equipotential bondings with ±200 mA current | 0.12 Ω…400 Ω acc. to IEC 61557-4 | 0.00 Ω…400 Ω | from 0.01 Ω | ±(2% m.v. + 3 digits) |
Measurement of resistance with low current | 0.0 Ω…1999 Ω | 0.0 Ω…1999 Ω | from 0.1 Ω | ±(3% m.v. + 3 digits) |
"m.v." - measured value